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KCI 후보
컴퓨터 비전시스템을 이용한 이진 패턴형상의 자동 검사장치 개발
An Automatic Inspection System for Binary Patterned Objects by Using A Computer Vision System
박찬혁 ( Chan Hyuk Park ) , 조재형 ( Jae Hyung Cho )
UCI I410-ECN-0102-2009-550-003243346

There are several techniques of inspection systems by using Computer Vision. The vision systems are used as a sensor substituting human eyes when the colors, conditions and dimension of products are inspected. In the inspection of shape, the systems measure the quality specification of inspected objects by comparing differences of parameters. Especially in inspection of ceramic sheets, the systems inspect difference of patterns, worn by physical force, chipping by production errors, impurity and dimensions of objects. In this research, a substitute for manual inspection which can be frequently differ by working condition, the inspection methods by using computer vision as a reliable inspection system is developed and conducted.

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