OLED displays use organic materials that emit light when electricity is applied. OLEDs enable emissive, bright, thin, flexible and efficient displays, and are set to replace LCDs in all display applications from small displays to large TV sets. This paper presents an accelerated degradation test for passive matrix OLED (PMOLED). Temperature, humidity and voltage are selected as acceleration stresses which affect the degradation of luminous flux of PMOLED. The failure times are predicted from the exponential degradation model, where the failure is defined as 50% decrease of luminous flux from the initial one. It is assumed that the lifetime distribution of PMOLED follows Weibull distribution and general linear life-stress relationship holds. The life-stress relationship and life characteristics at use condition are estimated by analyzing the accelerated life test data. The effect for selection of degradation models is also performed.