3.144.127.232
3.144.127.232
close menu
KCI 등재
ESD에 기인한 PMIC 불량 개선과 PCB 설계 방법
A PCB Design Method for Reducing PMIC Failure due to ESD
김진국 ( Jin Kuk Kim ) , 정인성 ( In Sung Jeong ) , 김창수 ( Chang Soo Kim )
UCI I410-ECN-0102-2016-530-000531240

This paper deals with a PCB design method to reduce PMIC’s failure due to ESD. Based on ESD scanning, system CDM and current spreading tests, it turns out that a current path between the PMIC and a PCB ground is the most important factor. It is shown that a certain number of vias are required to keep the impedance of the current path low. Also, it would be possible to design a robust PCB without the use of additional protective element.

[자료제공 : 네이버학술정보]
×